Advancing nanoscale discoveries with the new AFM 3DTIPs. Our latest article introduces 3D polymeric atomic force microscopy tips. microscopy 👉
By Harvey MusgraveOct 26 2022Reviewed by Megan Craig, M.Sc. In this article, 3D polymeric atomic force microscopy tips, referred to as 3DTIPs, are introduced. The key differences between standard silicon AFM tips and the new 3DTIPs design will be covered, as well as the impact these new probes will have on nanoscale research.
Comparing Atomic Force Microscopy Tips There are three key innovative differences between the silicon AFM tips available on the market and the new multipurpose 3DTIPs. Innovations Following AFM Tip Advancements The two-photon polymerisation technique is extremely flexible with the designs of the new AFM probes. This layer-by-layer printing method can facilitate complex structures that incorporate the tip, cantilever and mounting base with high precision.
Related StoriesThe team at AMMLab showed that 3DTIPs grant higher-resolution imaging than standard silicon tips, leading to more detailed topographical measurements of a variety of samples. The researchers did, however, discuss in their introductory paper one disadvantage to the 3DTIPs probes. In AFM, the quality factor describes how the energy is dissipated in the cantilever, such that a higher quality factor produces a lower energy dissipation per image.
Continue reading: Factors That Affect Atomic Force Microscope Images References and Further Reading Ayoub Glia, Muhammedin Deliorman & Mohammad A. Qasaimeh. 3D Generation of Multipurpose Atomic Force Microscopy Tips. Advanced Science, p. 2201489 DOI: 10.1002/advs.202201489